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Classification of test probes


  Probes according to electronic test purposes can be divided into:
 A, optical circuit board test probe: not installed components before the circuit board test and only open circuit, short circuit detection probe, most of the domestic probe products can replace imported products;
 B, on-line test probe: PCB circuit board after the installation of components after the detection probe; high-end products or the core technology in the hands of foreign companies, some domestic probe products have been successfully developed alternative to imported probe products;
 C, microelectronics test probe: the wafer test or chip IC detection probe, the core technology or in the hands of foreign companies, domestic manufacturers to actively participate in research and development, but only a small part of the successful production.
 Probes Main types: cantilever probes and vertical probes.
 Cantilever probes: Blade Type and Epoxy Type
 Vertical probe: Vertical type
 1, ICT probe (Probes)
 The general diameter between 2.54mm-1.27mm, the industry standard called 100mil, 75mil, 50mil, there are more special diameter of only 0.19mm, mainly for online circuit testing and functional testing. Also known as ICT testing and FCT testing. Is also the application of a more probe.
 2, interface probe (Interface Probes)
 Non-standard probes are generally custom-made for a small number of large test rigs, such as Teradyne and Agilent. Used to test the contact point and face of the machine with the test fixture.
 3, micro-probe (MicroSeries Probes)
 The distance between the two test points is generally 0.25mm to 0.76mm.
 4, switch probe (Switch Probes)
 Switch Probe A single probe has two currents.
 5, high-frequency probe (Coaxial Probes)
 Used to test high-frequency signals, with a shield can be tested within 10GHz and 500MHz without shielding.
 6, rotating probe (Rotator Probes)
 Elasticity is generally not high, because its penetration is already very strong, generally used for OSP processing PCBA test.
 7, high current probe (High Current Probes)
 The probe diameter is between 2.54mm and 4.75mm. The maximum test current is up to 39 amps.
 8, semiconductor probe (Semiconductor Probes)
 The diameter is generally between 0.50mm and 1.27mm. Bandwidth greater than 10GHz, 50Ω characteristic.
 9, battery contact probe (Battery and Connector Contacts)
 Generally used to optimize the contact effect, good stability and long life.
 In addition to the above types, there are temperature probes, Kelvin probes, etc., are less used.
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